Conference Report: INTERNATIONAL WORKSHOP ON INSTRUMENTED INDENTATION San Diego, CA April 22–23, 1995

An international workshop was held on April 22–23, 1995, at the Town and Country Hotel in San Diego, to discuss the scientific and standardization issues associated with instrumented indentation, also known as dynamic hardness testing or depth-sensing, ultra-low-load, or nano indentation. The workshop was sponsored jointly by the NIST Standard Reference Materials Program (SRMP) and the Institute for Mechanics and Materials (IMM) in San Diego, with additional support for student travel from Nano Instruments, Inc., Oak Ridge, TN, and Instron Corporation, Canton, MA, and was part of the program of the 1995 International Conference on Metallurgical Coatings and Thin Films (ICMCTF95). The 96 attendees represented 14 U.S. and 6 foreign companies, 18 U.S. and 7 foreign universities, and 15 national laboratories, including NIST, the National Physical Laboratory (NPL) in England and the Commonwealth Scientific and Industrial Research Organiza[J. Res. Natl. Inst. Stand. Technol. 101, 77 (1996)]